Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-1.2/1.3-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 1.2 µm holes with 1.3 µm spacing.
Mesh: 200
Material: Copper
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-4/2-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 4.0 µm holes with 2.0 µm spacing.
Mesh: 200
Material: Copper
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/4-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 4.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences Veco Hexagonal 300 mesh Gold Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter, 0.8 mil thickness.
Grid: Gold
Pitch: 83 µm
Hole: 45 µm
Bar: 38 µm
Electron Microscopy Sciences Formvar/Carbon Film 10 nm/1 nm thick on Square 100 mesh Copper Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Formvar is approximately 10 nm thick with 1 nm of carbon.
Grid: Copper
Electron Microscopy Sciences Glassine Negative Envelope Plain, 8 x 10"
Glassine envelopes, acid free for negative storage. Open end, thumb-cut, side-seamed.
Use: 8 x 10"
Electron Microscopy Sciences Gilder Rectangular Slotted Grid G75/300, Nickel
A reliable support specimen grid source. Features: well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. 3.05 mm diameter, 0.7 mil (18um) thickness.
Material: Nickel
Pitch: 340/83 µm
Hole: 290/58 µm
Bar: 50/25 µm
Electron Microscopy Sciences Cylinder Mount SEM 3/8" head, 3/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 3/8"
Pin height: 3/16"
Electron Microscopy Sciences CoverWell™ Imaging Chamber 1 well 20 mm, 0.8mm depth, 180 µl Volume
CoverWell Imaging reusable press-to-seal silicone chambers form a removable enclosure for repeat staining or specimen repositioning. The chambers are designed to stabilize and support thick and free-floating specimens for confocal microscopy and imaging applications.
Diameter: 20 mm
Depth: 0.8 mm
Volume: 180 µl
O.D.: 25 mm x 25 mm
Electron Microscopy Sciences Concentric Circles Microscope Graticle NE47, 21 mm, 10 circles 2 mm-20 mm
Can be used for two-way measurement when calibrated as a micrometer. There are 10 concentric circles 2mm-20mm in diameter. Surface chrome image.
Size: 21 mm
Electron Microscopy Sciences Calibration Specimen 700-1D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 700-1D, pattern: parallel ridges, nominal pitch: 700 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Electron Microscopy Sciences Calibration Specimen 150-1D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Has a nominal period (pitch) of 150 nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass).
Mount: Unmounted
Electron Microscopy Sciences SEM Mount Hitachi S-500 Threaded Pin, 1" Head, Aluminum
Hitachi S-500 threaded pin SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 1/4"
Electron Microscopy Sciences Synaptek GILDED NOTCH-NUMBERED Grid with 2x1 mm slot, Be-Cu
Synaptek unflexible grids are made of a special Beryllium-Copper alloy and very reliable under the electron beam. Offer extreme stability for coating with support film. 4 mil thick (100um), 3.05 mm diameter. Contamination free and reusable after cleaning.
I.D.: 2x1 mm slot
Material: Beryllium-Copper